Back to home
Ametek
 

NSG 3060-ANSI (discontinued)

Multifunction generator for Surge Combination Wave, Ring Wave, and EFT/Burst, for IEC and ANSI C62.41 & 45 testing.

NSG 3060-ANSIzoom
  • Complies with and exceeds requirements of IEC/EN 61000-4-4, -5, -12, and ANSI C62.41 & 45.
  • Surge Combination Wave 6.6 kV
  • Surge Ring Wave 6.6 kV
  • EFT/Burst 4.8 kV
  • 7.2" color display, touch panel, wheel with step size keys, Start-Stop-Pause keys and virtual keypad for easy and intuitive testing










 

Teseq’s new NSG 3060-ANSI generator is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3060-ANSI system is designed to fulfill conducted EMC test requirements for CE mark testing and ANSI C62.41, including Combination Wave Surge (6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), and Ring Wave (6.6 kV).

Featuring an innovative modular design, the NSG 3060-ANSI is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

 

Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5 and ANSI (IEEE) 62.41

Parameter Value

Pulse voltage (open circuit)

±200 V to 6.6 kV (in 1 V steps)

Pulse current (short circuit)

±100 A to 3.3 kA

Impedance

2/12 Ω

Polarity

positive / negative / alternate

Pulse repetition

5* to 20 s, up to 600 s (in 1 s steps)
* derated depending on selected pulse voltage and EUT supply voltage

Test duration

1 to 9999 pulses, continuous

Phase synchronization

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling

ANSI / IEC / external

 

Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4

Parameter Value

Pulse amplitude

±200 V to 4.8 kV (in 1 V steps) - open circuit
±100 V to 2.4 kV (50 Ω matching system)

Burst frequency

100 Hz to 1000 kHz

Polarity

positive / negative / alternate

Repetition time

1 ms to 4200 s (70 min)

Burst time

1 μs to 1999 s, single pulse, continuous

Test duration

1 s to 1000 h

Phase synchronization

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling

ANSI / IEC / external

 

Ringwave 0.5 μs/100 kHz
Pulse conforms to IEC/EN 61000-4-12 and ANSI (IEEE) C62.41

Parameter Value

Pulse voltage (open circuit)

± 200 V to 6.6 kV (in 1 V steps)

Pulse current (short circuit)

±16.6 to ±550 A, ±10%
±6.6 to ±220 A, ±10%
±1 to ±33 A, ±10%

Impedance

12/30/200 Ω

Polarity

positive / negative / alternate

Pulse repetition

5* to 20 s, up to 600 s (in 1 s steps)
* derated depending on selected pulse voltage and EUT supply voltage

Test duration

1 to 9999 pulses, continuous

Phase synchronization

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling

ANSI / IEC / external

  • Related Products

    Description

     
  • CDN 3061

    CDN 3061

    Single phase automatic 16 A coupling/decoupling networks (CDNs) for EFT/Burst, Surge, and Power Quality (Dips Interrupts & Variations) testing

  • CDN 3063

    CDN 3063

    Three phase automatic 32, 63 and 100 A coupling/decoupling networks (CDNs) for EFT/Burst and Surge

  • CDN 3083 Burst

    CDN 3083 Burst

    Three phase 690 VAC/1000 VDC 100 and 200 A manual coupling/decoupling networks (CDNs) for EFT/Burst

  • CDN 3083 Surge

    CDN 3083 Surge

    Three phase 440 VAC/DC and 620 VAC/DC 100 and 200 A manual coupling/decoupling networks (CDNs) for Surge

 
 
 

Imprint

AMETEK CTS GmbH
Sternenhofstr. 15
4153 Reinach, Switzerland
Tel.+ 41 61 204 41 00
marketing.cts@ametek.com

Managing Directors:
Brian Huntsman
Astrid Wälchli Schreiber
VAT-ID: CHE-179.452.414
Register of companies: CH-280.4.015.069-3


 
 
By continuing to use the site, you agree to our Privacy and Cookie Policy.